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US Patent Issued to DISCO on April 14 for "Processing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,699, issued on April 14, was assigned to DISCO Corp. (Tokyo). "Processing apparatus" was invented by Yunfeng Yang (Tokyo). According to t... Read More


US Patent Issued to EVATEC on April 14 for "Vacuum treatment apparatus and methods for manufacturing vacuum treated substrates" (Swiss, Liechtensteiner Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,700, issued on April 14, was assigned to EVATEC AG (Trubbach, Switzerland). "Vacuum treatment apparatus and methods for manufacturing vacu... Read More


US Patent Issued to EVATEC on April 14 for "Vacuum treatment apparatus and methods for manufacturing vacuum treated substrates" (Swiss, Liechtensteiner Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,700, issued on April 14, was assigned to EVATEC AG (Trubbach, Switzerland). "Vacuum treatment apparatus and methods for manufacturing vacu... Read More


US Patent Issued to ATT Advanced Temperature Test Systems on April 14 for "Modular wafer-chuck system" (German Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,701, issued on April 14, was assigned to ATT Advanced Temperature Test Systems GmbH (Planegg, Germany). "Modular wafer-chuck system" was i... Read More


US Patent Issued to ATT Advanced Temperature Test Systems on April 14 for "Modular wafer-chuck system" (German Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,701, issued on April 14, was assigned to ATT Advanced Temperature Test Systems GmbH (Planegg, Germany). "Modular wafer-chuck system" was i... Read More


US Patent Issued to Diodes on April 14 for "Calibration device" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,702, issued on April 14, was assigned to Diodes Inc. (Plano, Texas). "Calibration device" was invented by WanHui Li (Chengdu, China) and J... Read More


US Patent Issued to Diodes on April 14 for "Calibration device" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,702, issued on April 14, was assigned to Diodes Inc. (Plano, Texas). "Calibration device" was invented by WanHui Li (Chengdu, China) and J... Read More


US Patent Issued to Lam Research on April 14 for "Wafer chuck with thermal tuning cavity features" (California Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,703, issued on April 14, was assigned to Lam Research Corp. (Fremont, Calif.). "Wafer chuck with thermal tuning cavity features" was inven... Read More


US Patent Issued to Lam Research on April 14 for "Wafer chuck with thermal tuning cavity features" (California Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,703, issued on April 14, was assigned to Lam Research Corp. (Fremont, Calif.). "Wafer chuck with thermal tuning cavity features" was inven... Read More


US Patent Issued to DISCO on April 14 for "Wafer transfer method and wafer transfer apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,704, issued on April 14, was assigned to DISCO Corp. (Tokyo). "Wafer transfer method and wafer transfer apparatus" was invented by Kazuki ... Read More